Tkatchenko-Scheffler method: Difference between revisions
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*{{TAG|VDW_R0}}=[real array] : <math>R_0</math> parameters (in Å) for each species defined in the {{TAG|POSCAR}} file (this parameter overrides {{TAG|VDW_R0AU}}) | *{{TAG|VDW_R0}}=[real array] : <math>R_0</math> parameters (in Å) for each species defined in the {{TAG|POSCAR}} file (this parameter overrides {{TAG|VDW_R0AU}}) | ||
*{{TAG|LVDW_EWALD}}=.FALSE. : the lattice summation in <math>E_{\mathrm{disp}}</math> expression is computed by means of Ewald's summation (''.TRUE.'' ) or via a real space summation over all atomic pairs within cutoff radius {{TAG|VDW_RADIUS}} (''.FALSE.''). (available in VASP.5.3.4 and later) | *{{TAG|LVDW_EWALD}}=.FALSE. : the lattice summation in <math>E_{\mathrm{disp}}</math> expression is computed by means of Ewald's summation (''.TRUE.'' ) or via a real space summation over all atomic pairs within cutoff radius {{TAG|VDW_RADIUS}} (''.FALSE.''). (available in VASP.5.3.4 and later) | ||
*LTSSURF=.FALSE.: if set to .TRUE., the standard parametrization of the Tkatchenko-Scheffler method is replaced by the one designed to enable reliable modeling of structure and stability for a broad class of organic molecules adsorbed on metal surfaces is activated<ref>[https://journals.aps.org/prb/abstract/10.1103/PhysRevB.93.035118 V. G. Ruiz, W. Liu, and A. Tkatchenko, Phys. Rev. B 93, 035118 (2016).]</ref> | *{{TAG|LTSSURF}}=.FALSE.: if set to .TRUE., the standard parametrization of the Tkatchenko-Scheffler method is replaced by the one designed to enable reliable modeling of structure and stability for a broad class of organic molecules adsorbed on metal surfaces is activated<ref>[https://journals.aps.org/prb/abstract/10.1103/PhysRevB.93.035118 V. G. Ruiz, W. Liu, and A. Tkatchenko, Phys. Rev. B 93, 035118 (2016).]</ref> | ||
The performance of the Tkatchenko-Scheffler method in optimization of various crystalline systems has been examined in reference {{cite|bucko:prb:13}}. | The performance of the Tkatchenko-Scheffler method in optimization of various crystalline systems has been examined in reference {{cite|bucko:prb:13}}. |
Latest revision as of 10:48, 19 January 2024
The expression for the dispersion energy within the method of Tkatchenko and Scheffler[1] is formally identical to that of the DFT-D2 method. The important difference is, however, that the dispersion coefficients and damping function are charge-density dependent. The Tkatchenko-Scheffler method is therefore able to take into account variations in vdW contributions of atoms due to their local chemical environment. In this method the polarizability, dispersion coefficients, and atomic radii of an atom in a molecule or a solid are computed from their free-atomic values using the following relations:
The free-atomic quantities and are tabulated for all elements from the first six rows of the periodic table except for lanthanides. If a Tkatchenko-Scheffler calculation is performed for the system containing an unsupported element, the user has to define the corresponding values using the tags VDW_ALPHA, VDW_C6 and VDW_R0 (see below). The effective atomic volumes are determined using the Hirshfeld partitioning of the all-electron density:
where is the total electron density and is the spherically averaged electron density of the neutral free atomic species . The Hirshfeld weight is defined by free atomic densities as follows:
The combination rule to define the strength of the dipole-dipole dispersion interaction between unlike species is:
The parameter used in the damping function of the DFT-D2 method is obtained from the atom-in-molecule vdW radii as follows:
The Tkatchenko-Scheffler method is invoked by setting IVDW=2|20. The following parameters can be optionally defined in INCAR (the given values are the default ones):
- LVDWSCS=.FALSE. : activates the self-consistent screening in Tkatchenko-Scheffler method
- VDW_RADIUS=50.0 : cutoff radius (in Å) for pair interactions
- VDW_S6=1.00 : global scaling factor
- VDW_SR=0.94 : scaling factor
- VDW_D=20.0 : damping parameter
- VDW_ALPHA=[real array] : free-atomic polarizabilities (atomic units) for each species defined in the POSCAR file
- VDW_C6AU=[real array] : free-atomic parameters (atomic units) for each species defined in the POSCAR file
- VDW_C6=[real array] : free-atomic parameters () for each species defined in the POSCAR file (this parameter overrides VDW_C6AU)
- VDW_R0AU=[real array] : free-atomic parameters (atomic units) for each species defined in the POSCAR file
- VDW_R0=[real array] : parameters (in Å) for each species defined in the POSCAR file (this parameter overrides VDW_R0AU)
- LVDW_EWALD=.FALSE. : the lattice summation in expression is computed by means of Ewald's summation (.TRUE. ) or via a real space summation over all atomic pairs within cutoff radius VDW_RADIUS (.FALSE.). (available in VASP.5.3.4 and later)
- LTSSURF=.FALSE.: if set to .TRUE., the standard parametrization of the Tkatchenko-Scheffler method is replaced by the one designed to enable reliable modeling of structure and stability for a broad class of organic molecules adsorbed on metal surfaces is activated[2]
The performance of the Tkatchenko-Scheffler method in optimization of various crystalline systems has been examined in reference [3].
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Related tags and articles
VDW_RADIUS, VDW_S6, VDW_SR, VDW_D, VDW_ALPHA, VDW_C6AU, VDW_C6, VDW_R0AU, VDW_R0, LVDW_EWALD, IVDW, Tkatchenko-Scheffler method with iterative Hirshfeld partitioning, Self-consistent screening in Tkatchenko-Scheffler method, Many-body dispersion energy, Many-body dispersion energy with fractionally ionic model for polarizability